Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11841395 | Integrated circuit margin measurement and failure prediction device | Evelyn Landman, Shai Cohen, Yahel DAVID, Eyal Fayneh | 2023-12-12 |
| 11762789 | Integrated circuit I/O integrity and degradation monitoring | Eyal Fayneh, Evelyn Landman, Shai Cohen, Guy REDLER | 2023-09-19 |
| 11740281 | Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing | Eyal Fayneh, Edi Shmueli, Alexander BURLAK, Evelyn Landman, Yahel DAVID +2 more | 2023-08-29 |