Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11740281 | Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing | Eyal Fayneh, Edi Shmueli, Evelyn Landman, Inbar WEINTROB, Yahel DAVID +2 more | 2023-08-29 |