| 11688483 |
Managing block retirement for temporary operational conditions |
Kishore Kumar Muchherla, Scott Anthony Stoller, Preston A. Thomson, Kevin R. Brandt, Marc S. Hamilton +1 more |
2023-06-27 |
| 11687452 |
Dynamic program-verify voltage adjustment for intra-block storage charge loss uniformity |
Gary F. Besinga, Renato C. Padilla, Tawalin Opastrakoon, Michael G. Miller, Christopher M. Smitchger +2 more |
2023-06-27 |
| 11675529 |
Threshold voltage determination for calibrating voltage bins of a memory device |
Kishore Kumar Muchherla, Shane Nowell, Peter Feeley, Sivagnanam Parthasarathy, Mustafa N. Kaynak |
2023-06-13 |
| 11676664 |
Voltage bin selection for blocks of a memory device after power up of the memory device |
Kishore Kumar Muchherla, Shane Nowell, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Karl D. Schuh +2 more |
2023-06-13 |
| 11670381 |
Read voltage calibration based on host IO operations |
Ashutosh Malshe, Kishore Kumar Muchherla, Harish Reddy Singidi, Peter Feeley, Kulachet Tanpairoj +1 more |
2023-06-06 |
| 11662786 |
Temperature compensation in a memory system |
Shane Nowell, Vamsi Pavan Rayaprolu |
2023-05-30 |
| 11644979 |
Selective accelerated sampling of failure- sensitive memory pages |
Kishore Kumar Muchherla, Gary F. Besinga, Cory M. Steinmetz, Pushpa Seetamraju, Jiangang Wu +1 more |
2023-05-09 |
| 11620074 |
Voltage bin calibration based on a voltage distribution reference voltage |
Kishore Kumar Muchherla, Devin M. Batutis, Xiangang Luo, Mustafa N. Kaynak, Peter Feeley +2 more |
2023-04-04 |
| 11610632 |
NAND temperature data management |
Kishore Kumar Muchherla, Preston A. Thomson, Harish Reddy Singidi, Jung Sheng Hoei, Peter Feeley +1 more |
2023-03-21 |
| 11593261 |
Memory device with dynamic cache management |
Kishore Kumar Muchherla, Peter Feeley, Ashutosh Malshe, Daniel J. Hubbard, Christopher S. Hale +3 more |
2023-02-28 |
| 11593005 |
Managing voltage bin selection for blocks of a memory device |
Kishore Kumar Muchherla, Mustafa N. Kaynak, Peter Feeley, Shane Nowell, Sivagnanam Parthasarathy +2 more |
2023-02-28 |
| 11587627 |
Determining voltage offsets for memory read operations |
Kishore Kumar Muchherla, Mustafa N. Kaynak, Shane Nowell, Peter Feeley, Sivagnanam Parthasarathy |
2023-02-21 |
| 11587639 |
Voltage calibration scans to reduce memory device overhead |
Kishore Kumar Muchherla, Mustafa N. Kaynak, Sivagnanam Parthasarathy, Xiangang Luo, Peter Feeley +4 more |
2023-02-21 |
| 11586357 |
Memory management |
Kishore Kumar Muchherla, Ashutosh Malshe, Preston A. Thomson, Michael G. Miller, Renato C. Padilla +1 more |
2023-02-21 |
| 11544188 |
Memory device with dynamic storage mode control |
Yun Li, Kishore Kumar Muchherla, Peter Feeley, Ashutosh Malshe, Daniel J. Hubbard +2 more |
2023-01-03 |
| 11544008 |
Temperature correction in memory sub-systems |
Gianni Stephen Alsasua, Karl D. Schuh, Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu +2 more |
2023-01-03 |
