Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815819 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Ran YACOBY, Shay Yogev, Boaz STURLESI, Oded Cohen | 2023-11-14 |
| 11763181 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more | 2023-09-19 |
| 11665040 | Configurable constellation mapping to control spectral efficiency versus signal-to-noise ratio | Bernard Arambepola, Sahan S. Gamage, Thushara Hewavithana, Shaul Shulman | 2023-05-30 |