Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11763181 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more | 2023-09-19 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11763181 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more | 2023-09-19 |