Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11763181 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2023-09-19 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11763181 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2023-09-19 |