Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815819 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Noam Tal, Shay Yogev, Boaz STURLESI, Oded Cohen | 2023-11-14 |
| 11747740 | Self-supervised representation learning for interpretation of OCD data | Boaz STURLESI | 2023-09-05 |