Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815819 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Ran YACOBY, Noam Tal, Shay Yogev, Oded Cohen | 2023-11-14 |
| 11774837 | Image displaying device and method for displaying an image on a screen | Mathieu Rayer | 2023-10-03 |
| 11747740 | Self-supervised representation learning for interpretation of OCD data | Ran YACOBY | 2023-09-05 |