Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11822255 | Process window based on defect probability | Abraham SLACHTER, Stefan Hunsche, Wim Tjibbo Tel, Anton Bernhard Van Oosten, Koenraad VAN INGEN SCHENAU +1 more | 2023-11-21 |
| 11815349 | Methods and systems for inspecting integrated circuits based on X-rays | Hak Chuah Sim, Andrew George Reid, Nabil Farah Dawahre Olivieri | 2023-11-14 |