Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852657 | Tester and method for calibrating probe card and device under testing (DUT) | Yung-Shiuan Chen, Tzu-Chia LIU, Hsin-Hsuan Chen, Wei Wang, Shan Zhang +2 more | 2023-12-26 |
| 11614481 | Through-silicon via detecting circuit, detecting methods and integrated circuit thereof | Yi-Jun Lu, Cheng-Jer Yang | 2023-03-28 |