Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852657 | Tester and method for calibrating probe card and device under testing (DUT) | You-Hsien Lin, Yung-Shiuan Chen, Tzu-Chia LIU, Wei Wang, Shan Zhang +2 more | 2023-12-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852657 | Tester and method for calibrating probe card and device under testing (DUT) | You-Hsien Lin, Yung-Shiuan Chen, Tzu-Chia LIU, Wei Wang, Shan Zhang +2 more | 2023-12-26 |