Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852657 | Tester and method for calibrating probe card and device under testing (DUT) | You-Hsien Lin, Tzu-Chia LIU, Hsin-Hsuan Chen, Wei Wang, Shan Zhang +2 more | 2023-12-26 |
| 11609705 | Memory detection method and detection apparatus | Zhe Zhao, Longjie Sun, Lung Yang, Lanping Xu | 2023-03-21 |