Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11830553 | Word line drive circuit and dynamic random access memory | — | 2023-11-28 |
| 11715543 | Memory test circuit apparatus and test method | — | 2023-08-01 |
| 11614481 | Through-silicon via detecting circuit, detecting methods and integrated circuit thereof | You-Hsien Lin, Yi-Jun Lu | 2023-03-28 |