Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11726410 | Multi-resolution overlay metrology targets | Eitan Hajaj, Amnon Manassen, Shlomo Eisenbach, Anna Golotsvan, Eugene Maslovsky | 2023-08-15 |
| 11676909 | Metrology targets for high topography semiconductor stacks | Eitan Hajaj | 2023-06-13 |