Issued Patents 2023
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854765 | Multiple charged-particle beam apparatus and methods | Weiming Ren, Xuedong Liu, Xuerang Hu, Martinus Gerardus Johannes Maria MAASSEN | 2023-12-26 |
| 11851215 | Systems and methods for calibrating a synthetic image on an avionic display | Zuowei He, Gang He, Zhiguo Ren | 2023-12-26 |
| 11815473 | Methods of inspecting samples with multiple beams of charged particles | Kuo-Feng TSENG, Zhonghua Dong, Yixiang Wang | 2023-11-14 |
| 11804356 | Apparatus using multiple beams of charged particles | Xuerang Hu, Weiming Ren, Xuedong Liu | 2023-10-31 |
| 11721521 | Multi-beam inspection apparatus with improved detection performance of signal electrons | Weiming Ren, Xuedong Liu, Xuerang Hu | 2023-08-08 |
| 11688579 | Electron emitter and method of fabricating same | Juying Dou, Zheng Fan, Tzu-Yi Kuo | 2023-06-27 |
| 11676793 | Apparatus of plural charged particle beams | Weiming Ren, Xuedong Liu, Xuerang Hu | 2023-06-13 |
| 11670477 | Apparatus using charged particle beams | Xuerang Hu, Xuedong Liu, Weiming Ren | 2023-06-06 |
| 11655469 | MicroRNAs and methods of their use | Anthony SALEH, Carter Van Waes, Hui Cheng | 2023-05-23 |
| 11594396 | Multi-beam inspection apparatus with single-beam mode | Weiming Ren, Xuedong Liu, Xuerang Hu | 2023-02-28 |