Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815473 | Methods of inspecting samples with multiple beams of charged particles | Zhonghua Dong, Yixiang Wang, Zhong-Wei Chen | 2023-11-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815473 | Methods of inspecting samples with multiple beams of charged particles | Zhonghua Dong, Yixiang Wang, Zhong-Wei Chen | 2023-11-14 |