Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11790515 | Detecting defects in semiconductor specimens using weak labeling | Irad Peleg, Ran Schleyen | 2023-10-17 |
| 11756188 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Ishai Schwarzband, Evgeny Bal, Ariel Shkalim | 2023-09-12 |
| 11568531 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Ohad Shaubi, Denis Suhanov, Assaf Asbag | 2023-01-31 |