Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11790515 | Detecting defects in semiconductor specimens using weak labeling | Ran Schleyen, Boaz Cohen | 2023-10-17 |
| 11562476 | Determination of a simulated image of a specimen | — | 2023-01-24 |