Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11756188 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Boaz Cohen, Evgeny Bal, Ariel Shkalim | 2023-09-12 |
| 11651509 | Method, system and computer program product for 3D-NAND CDSEM metrology | Roman Kris, Roi Meir, Sahar LEVIN, Grigory Klebanov, Shimon Levi +6 more | 2023-05-16 |