Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353799 | System and method for error reduction for metrology measurements | Roie Volkovich, Liran Yerushalmi, Anna Golotsvan, Rawi Dirawi, Chen Dror +3 more | 2022-06-07 |
| 11347045 | Ptychography based system and method | Oren Cohen, Gil Ilan Haham, Pavel Sidorenko, Or PELEG, Bing Kuan Chen | 2022-05-31 |