Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11402405 | Frequency tracking for subsurface atomic force microscopy | Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es, Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen | 2022-08-02 |
| 11320454 | Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample | Hamed Sadeghian Marnani, Aukje Arianne Annette Kastelijn, Peter Martijn Toet, Geerten Frans Ijsbrand Kramer, Evert Nieuwkoop +2 more | 2022-05-03 |