Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11493325 | Device and method for interferometric measurement of a two or three dimensional translation of an object | Lun Kai Cheng, Arno Willem Frederik Volker | 2022-11-08 |
| 11320454 | Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample | Hamed Sadeghian Marnani, Aukje Arianne Annette Kastelijn, Geerten Frans Ijsbrand Kramer, Evert Nieuwkoop, Albert Dekker +2 more | 2022-05-03 |