Issued Patents 2022
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11402405 | Frequency tracking for subsurface atomic force microscopy | Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es, Rutger Meijer Timmerman Thijssen, Martinus Cornelius Johannes Maria van Riel | 2022-08-02 |
| 11327092 | Subsurface atomic force microscopy with guided ultrasound waves | Daniele Piras, Paul Louis Maria Joseph VAN NEER | 2022-05-10 |
| 11320454 | Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample | Aukje Arianne Annette Kastelijn, Peter Martijn Toet, Geerten Frans Ijsbrand Kramer, Evert Nieuwkoop, Albert Dekker +2 more | 2022-05-03 |
| 11289367 | Method, atomic force microscopy system and computer program product | Violeta Navarro Paredes, Abbas Mohtashami | 2022-03-29 |
| 11268935 | Method of and atomic force microscopy system for performing subsurface imaging | Daniele Piras, Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es | 2022-03-08 |
| 11221214 | Distance sensor, alignment system and method | — | 2022-01-11 |