PN

Paul Louis Maria Joseph VAN NEER

📍 Bergschenhoek, NL: #1 of 5 inventorsTop 20%
Overall (2022): #66,790 of 548,613Top 15%
3
Patents 2022

Issued Patents 2022

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11402405 Frequency tracking for subsurface atomic force microscopy Maarten Hubertus van Es, Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen, Martinus Cornelius Johannes Maria van Riel 2022-08-02
11327092 Subsurface atomic force microscopy with guided ultrasound waves Daniele Piras, Hamed Sadeghian Marnani 2022-05-10
11268935 Method of and atomic force microscopy system for performing subsurface imaging Daniele Piras, Maarten Hubertus van Es, Hamed Sadeghian Marnani 2022-03-08