Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11402405 | Frequency tracking for subsurface atomic force microscopy | Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen, Martinus Cornelius Johannes Maria van Riel | 2022-08-02 |
| 11268935 | Method of and atomic force microscopy system for performing subsurface imaging | Daniele Piras, Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani | 2022-03-08 |