Issued Patents 2022
Showing 25 most recent of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11532373 | Managing error-handling flows in memory devices | Shane Nowell, Mustafa N. Kaynak, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy +2 more | 2022-12-20 |
| 11527291 | Performing a program operation based on a high voltage pulse to securely erase data | Harish Reddy Singidi, Vamsi Pavan Rayaprolu, Ashutosh Malshe, Sampath K. Ratnam | 2022-12-13 |
| 11527294 | Memory sub-system scan | Vamsi Pavan Rayaprolu, Karl D. Schuh, Jeffrey S. McNeil, Ashutosh Malshe, Jiangang Wu | 2022-12-13 |
| 11521699 | Adjusting a reliability scan threshold in a memory sub-system | Vamsi Pavan Rayaprolu, Ashutosh Malshe, Gianni Stephen Alsasua, Harish Reddy Singidi | 2022-12-06 |
| 11520699 | Using a common pool of blocks for user data and a system data structure | Kulachet Tanpairoj, Peter Feeley, Sampath K. Ratnam, Ashutosh Malshe | 2022-12-06 |
| 11507300 | Word line group read counters | Michael G. Miller, Ashutosh Malshe, Gianni Stephen Alsasua, Renato C. Padilla, Vamsi Pavan Rayaprolu +1 more | 2022-11-22 |
| 11507317 | Establishing a delay period associated with a program resume operation of a memory subsystem | Jiangang Wu, Sampath K. Ratnam, Yang Zhang, Guang Chang Ye, Hong Lu +2 more | 2022-11-22 |
| 11500564 | Grouping blocks based on power cycle and power on time | Mustafa N. Kaynak, Jiangang Wu, Sampath K. Ratnam, Sivagnanam Parthasarathy, Peter Feeley +1 more | 2022-11-15 |
| 11494102 | Media management operations based on a ratio of valid data | Ashutosh Malshe, Vamsi Pavan Rayaprolu | 2022-11-08 |
| 11487436 | Trims corresponding to logical unit quantity | Jeffrey S. McNeil, Niccolo' Righetti, Akira Goda, Todd A. Marquart, Mark A. Helm +4 more | 2022-11-01 |
| 11481273 | Partitioned memory having error detection capability | Niccolo′ Righetti, Jeffrey S. McNeil, Akira Goda, Todd A. Marquart, Mark A. Helm +4 more | 2022-10-25 |
| 11474738 | Probabilistic data integrity scan enhanced by a supplemental data integrity scan | Saeed Sharifi Tehrani, Ashutosh Malshe, Sivagnanam Parthasarathy, Vamsi Pavan Rayaprolu | 2022-10-18 |
| 11475969 | Scan optimization using data selection across wordline of a memory array | Violante Moschiano, Sead Zildzic, Junwyn A. Lacsao, Paing Z. Htet | 2022-10-18 |
| 11467980 | Performing a media management operation based on a sequence identifier for a block | Peter Feeley, Sampath K. Ratnam, Ashutosh Malshe | 2022-10-11 |
| 11462280 | Adjusting pass-through voltage based on threshold voltage shift | Mustafa N. Kaynak, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy | 2022-10-04 |
| 11462265 | Reading memory cells coarsely programmed via interleaved two-pass data programming techniques | Phong Sy Nguyen, James Fitzpatrick | 2022-10-04 |
| 11456037 | Block read count voltage adjustment | Harish Reddy Singidi, Gianni Stephen Alsasua, Ashutosh Malshe, Sampath K. Ratnam, Gary F. Besinga +1 more | 2022-09-27 |
| 11456038 | Simplified operations to read memory cells coarsely programmed via interleaved two-pass data programming techniques | Phong Sy Nguyen, James Fitzpatrick | 2022-09-27 |
| 11455109 | Automatic wordline status bypass management | Jiangang Wu, Jung Sheng Hoei, Qisong Lin | 2022-09-27 |
| 11450392 | Selective read disturb sampling | Harish Reddy Singidi, Renato C. Padilla, Vamsi Pavan Rayaprolu, Ashutosh Malshe, Sampath K. Ratnam | 2022-09-20 |
| 11449271 | Implementing fault tolerant page stripes on low density memory systems | Mark A. Helm, Giuseppina Puzzilli, Peter Feeley, Yifen Liu, Violante Moschiano +2 more | 2022-09-20 |
| 11450391 | Multi-tier threshold voltage offset bin calibration | Shane Nowell, Mustafa N. Kaynak, Karl D. Schuh, Jiangang Wu, Devin M. Batutis +1 more | 2022-09-20 |
| 11442641 | Voltage based combining of block families for memory devices | Michael Sheperek, Shane Nowell | 2022-09-13 |
| 11443830 | Error avoidance based on voltage distribution parameters of block families | Michael Sheperek, Shane Nowell, Mustafa N. Kaynak, Larry J. Koudele | 2022-09-13 |
| 11437108 | Voltage bin calibration based on a temporary voltage shift offset | Karl D. Schuh, Mustafa N. Kaynak, Xiangang Luo, Shane Nowell, Devin M. Batutis +4 more | 2022-09-06 |