| 11521699 |
Adjusting a reliability scan threshold in a memory sub-system |
Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Ashutosh Malshe, Harish Reddy Singidi |
2022-12-06 |
| 11507300 |
Word line group read counters |
Michael G. Miller, Ashutosh Malshe, Renato C. Padilla, Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla +1 more |
2022-11-22 |
| 11456037 |
Block read count voltage adjustment |
Harish Reddy Singidi, Kishore Kumar Muchherla, Ashutosh Malshe, Sampath K. Ratnam, Gary F. Besinga +1 more |
2022-09-27 |
| 11335394 |
Temperature informed memory refresh |
Harish Reddy Singidi, Kishore Kumar Muchherla, Sampath K. Ratnam, Ashutosh Malshe, Vamsi Pavan Rayaprolu +1 more |
2022-05-17 |
| 11301146 |
Storing page write attributes |
Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Kishore Kumar Muchherla, Harish Reddy Singidi, Ashutosh Malshe |
2022-04-12 |
| 11287998 |
Read count scaling factor for data integrity scan |
Kishore Kumar Muchherla, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Harish Reddy Singidi |
2022-03-29 |
| 11282564 |
Selective wordline scans based on a data state metric |
Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Harish Reddy Singidi, Ashutosh Malshe |
2022-03-22 |
| 11269553 |
Adjusting scan event thresholds to mitigate memory errors |
Harish Reddy Singidi, Peter Feeley, Ashutosh Malshe, Renato C. Padilla, Kishore Kumar Muchherla +1 more |
2022-03-08 |
