| 11520487 |
Managing write operations during a power loss |
James P. Crowley |
2022-12-06 |
| 11495322 |
First-pass continuous read level calibration |
Larry J. Koudele, Bruce A. Liikanen |
2022-11-08 |
| 11443830 |
Error avoidance based on voltage distribution parameters of block families |
Kishore Kumar Muchherla, Shane Nowell, Mustafa N. Kaynak, Larry J. Koudele |
2022-09-13 |
| 11442641 |
Voltage based combining of block families for memory devices |
Kishore Kumar Muchherla, Shane Nowell |
2022-09-13 |
| 11435919 |
Associating multiple cursors with block family of memory device |
Bruce A. Liikanen, Peter Feeley, Larry J. Koudele, Shane Nowell, Steven Michael Kientz |
2022-09-06 |
| 11429504 |
Closing block family based on soft and hard closure criteria |
Larry J. Koudele, Steven S. Williams |
2022-08-30 |
| 11423989 |
Generating embedded data in memory cells in a memory sub-system |
Bruce A. Liikanen, Larry J. Koudele |
2022-08-23 |
| 11416173 |
Memory system with dynamic calibration using a variable adjustment mechanism |
Larry J. Koudele, Steve Kientz |
2022-08-16 |
| 11404139 |
Smart sampling for block family scan |
Vamsi Pavan Rayaprolu, Shane Nowell, Steven Michael Kientz |
2022-08-02 |
| 11404124 |
Voltage bin boundary calibration at memory device power up |
Bruce A. Liikanen, Steve Kientz |
2022-08-02 |
| 11392328 |
Dynamic background scan optimization in a memory sub-system |
Gerald L. Cadloni, Francis Chew, Bruce A. Liikanen, Larry J. Koudele |
2022-07-19 |
| 11393534 |
Adjustment of a starting voltage corresponding to a program operation in a memory sub-system |
Bruce A. Liikanen, Larry J. Koudele |
2022-07-19 |
| 11373712 |
Dynamic programming of valley margins |
Larry J. Koudele, Bruce A. Liikanen |
2022-06-28 |
| 11361825 |
Dynamic program erase targeting with bit error rate |
Bruce A. Liikanen, Larry J. Koudele |
2022-06-14 |
| 11354043 |
Temperature-based block family combinations in a memory device |
Steven Michael Kientz, Larry J. Koudele, Shane Nowell, Bruce A. Liikanen |
2022-06-07 |
| 11340813 |
Reliability scan assisted voltage bin selection |
Vamsi Pavan Rayaprolu, Shane Nowell |
2022-05-24 |
| 11309020 |
Dragging first pass read level thresholds based on changes in second pass read level thresholds |
Larry J. Koudele, Bruce A. Liikanen |
2022-04-19 |
| 11301382 |
Write data for bin resynchronization after power loss |
Bruce A. Liikanen, Steven Michael Kientz |
2022-04-12 |
| 11288009 |
Read sample offset bit determination using most probably decoder logic in a memory sub-system |
Bruce A. Liikanen |
2022-03-29 |
| 11270772 |
Voltage offset bin selection by die group for memory devices |
Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Larry J. Koudele, Shane Nowell |
2022-03-08 |
| 11263134 |
Block family combination and voltage bin selection |
Larry J. Koudele, Mustafa N. Kaynak, Shane Nowell |
2022-03-01 |
| 11231995 |
Providing data of a memory system based on an adjustable error rate |
Mustafa N. Kaynak, Larry J. Koudele, Patrick R. Khayat, Sampath K. Ratnam |
2022-01-25 |
| 11231863 |
Block family-based error avoidance for memory devices |
Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen, Peter Feeley +3 more |
2022-01-25 |
| 11217320 |
Bin placement according to program-erase cycles |
Mustafa N. Kaynak, Steven Michael Kientz |
2022-01-04 |
