| 11532373 |
Managing error-handling flows in memory devices |
Kishore Kumar Muchherla, Mustafa N. Kaynak, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy +2 more |
2022-12-20 |
| 11450391 |
Multi-tier threshold voltage offset bin calibration |
Kishore Kumar Muchherla, Mustafa N. Kaynak, Karl D. Schuh, Jiangang Wu, Devin M. Batutis +1 more |
2022-09-20 |
| 11443830 |
Error avoidance based on voltage distribution parameters of block families |
Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Larry J. Koudele |
2022-09-13 |
| 11442641 |
Voltage based combining of block families for memory devices |
Michael Sheperek, Kishore Kumar Muchherla |
2022-09-13 |
| 11435919 |
Associating multiple cursors with block family of memory device |
Michael Sheperek, Bruce A. Liikanen, Peter Feeley, Larry J. Koudele, Steven Michael Kientz |
2022-09-06 |
| 11437108 |
Voltage bin calibration based on a temporary voltage shift offset |
Kishore Kumar Muchherla, Karl D. Schuh, Mustafa N. Kaynak, Xiangang Luo, Devin M. Batutis +4 more |
2022-09-06 |
| 11429309 |
Adjusting a parameter for a programming operation based on the temperature of a memory system |
Mustafa N. Kaynak, Sampath K. Ratnam, Zixiang Loh, Nagendra Prasad Ganesh Rao, Larry K Koudele +2 more |
2022-08-30 |
| 11410734 |
Voltage bin selection for blocks of a memory device after power up of the memory device |
Kishore Kumar Muchherla, Sampath K. Ratnam, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Karl D. Schuh +2 more |
2022-08-09 |
| 11404139 |
Smart sampling for block family scan |
Vamsi Pavan Rayaprolu, Michael Sheperek, Steven Michael Kientz |
2022-08-02 |
| 11393541 |
Mitigating a voltage condition of a memory cell in a memory sub-system |
Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Sivagnanam Parthasarathy +2 more |
2022-07-19 |
| 11372545 |
Managing bin placement for block families of a memory device based on trigger metric values |
Mustafa N. Kaynak |
2022-06-28 |
| 11354043 |
Temperature-based block family combinations in a memory device |
Steven Michael Kientz, Larry J. Koudele, Michael Sheperek, Bruce A. Liikanen |
2022-06-07 |
| 11340813 |
Reliability scan assisted voltage bin selection |
Vamsi Pavan Rayaprolu, Michael Sheperek |
2022-05-24 |
| 11270772 |
Voltage offset bin selection by die group for memory devices |
Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Michael Sheperek, Larry J. Koudele |
2022-03-08 |
| 11263134 |
Block family combination and voltage bin selection |
Michael Sheperek, Larry J. Koudele, Mustafa N. Kaynak |
2022-03-01 |
| 11231863 |
Block family-based error avoidance for memory devices |
Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen +3 more |
2022-01-25 |
| 11221912 |
Mitigating an undetectable error when retrieving critical data during error handling |
Vamsi Pavan Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Renato C. Padilla |
2022-01-11 |
