Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378394 | On-the-fly scatterometry overlay metrology target | Yuri Paskover, Itay Gdor, Vladimir Levinski, Alexander Volfman, Yoram Uziel | 2022-07-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378394 | On-the-fly scatterometry overlay metrology target | Yuri Paskover, Itay Gdor, Vladimir Levinski, Alexander Volfman, Yoram Uziel | 2022-07-05 |