Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11428650 | Computationally efficient x-ray based overlay measurement | Andrei V. Shchegrov, Michael S. Bakeman | 2022-08-30 |
| 11313816 | Full beam metrology for x-ray scatterometry systems | Antonio Arion Gellineau, Thaddeus Gerard Dziura, Andrei Veldman, Sergey Zalubovsky | 2022-04-26 |
| 11305178 | Chess variant including additional player piece and method of play | — | 2022-04-19 |