Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11416982 | Controlling a process for inspection of a specimen | Bjorn Brauer, Hucheng Lee | 2022-08-16 |
| 11308606 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Hucheng Lee, Xiaochun Li | 2022-04-19 |