| 11489118 |
Reliable resistive random access memory |
Chih-Chao Yang, Ernest Y. Wu, Andrew Tae Kim |
2022-11-01 |
| 11302639 |
Footing flare pedestal structure |
Chih-Chao Yang, Ashim Dutta |
2022-04-12 |
| 11282788 |
Interconnect and memory structures formed in the BEOL |
Chih-Chao Yang |
2022-03-22 |
| 11276748 |
Switchable metal insulator metal capacitor |
Chih-Chao Yang, Andrew Tae Kim, Barry P. Linder |
2022-03-15 |
| 11257750 |
E-fuse co-processed with MIM capacitor |
Chih-Chao Yang, Jim Shih-Chun Liang, Ernest Y. Wu |
2022-02-22 |
| 11251179 |
Long channel and short channel vertical FET co-integration for vertical FET VTFET |
Terence B. Hook, Kirk D. Peterson, Junli Wang |
2022-02-15 |
| 11244850 |
On integrated circuit (IC) device simultaneously formed capacitor and resistor |
Jim Shih-Chun Liang, Chih-Chao Yang |
2022-02-08 |
| 11239278 |
Bottom conductive structure with a limited top contact area |
Chih-Chao Yang, Theodorus E. Standaert, Koichi Motoyama |
2022-02-01 |
| 11227796 |
Enhancement of iso-via reliability |
Lawrence A. Clevenger, Xiao Hu Liu, Kirk D. Peterson |
2022-01-18 |
