Issued Patents 2021
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11181831 | Methods of manufacturing semiconductor device | Kyoung Hwan Lee, Young Ho Kwon, Souk Kim, Young-Hoon Sohn | 2021-11-23 |
| 11043433 | Method of inspecting surface and method of manufacturing semiconductor device | Sung Yoon Ryu, Chung-Sam Jun, Yun-Jung Jee, Gil-woo Song | 2021-06-22 |
| 11037283 | Inspecting apparatus based on hyperspectral imaging | Sung Ho JANG, Yasuhiro Hidaka, Young Kyu Park, Ye Eun PARK | 2021-06-15 |
| 11017525 | Semiconductor pattern detecting apparatus | Jae Hyung AHN, Souk Kim, Joon-Seo Song, Young-Hoon Sohn | 2021-05-25 |
| 10989520 | Methods for nondestructive measurements of thickness of underlying layers | Duck Mahn Oh, Jong-An Kim, Si-hyeon Choi, Young-Hoon Sohn, Chi Hoon Lee | 2021-04-27 |
| 10969428 | Method of inspecting pattern defect | Young-Hoon Sohn, Chung-Sam Jun | 2021-04-06 |