Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11043433 | Method of inspecting surface and method of manufacturing semiconductor device | Sung Yoon Ryu, Yu-Sin Yang, Yun-Jung Jee, Gil-woo Song | 2021-06-22 |
| 10969428 | Method of inspecting pattern defect | Young-Hoon Sohn, Yu-Sin Yang | 2021-04-06 |