Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11181831 | Methods of manufacturing semiconductor device | Kyoung Hwan Lee, Young Ho Kwon, Souk Kim, Yu-Sin Yang | 2021-11-23 |
| 11017525 | Semiconductor pattern detecting apparatus | Jae Hyung AHN, Souk Kim, Joon-Seo Song, Yu-Sin Yang | 2021-05-25 |
| 10989520 | Methods for nondestructive measurements of thickness of underlying layers | Duck Mahn Oh, Jong-An Kim, Si-hyeon Choi, Yu-Sin Yang, Chi Hoon Lee | 2021-04-27 |
| 10969428 | Method of inspecting pattern defect | Chung-Sam Jun, Yu-Sin Yang | 2021-04-06 |