Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff +1 more | 2021-12-21 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff +1 more | 2021-05-18 |