Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11204312 | In-situ full wafer metrology system | Ami Sade, Todd Egan, Shay Assaf | 2021-12-21 |
JN
Jacob Newman
Overall (2021): #416,574 of 548,734Top 80%
1
Patents 2021