Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11204312 | In-situ full wafer metrology system | Ami Sade, Todd Egan, Jacob Newman | 2021-12-21 |
SA
Shay Assaf
Overall (2021): #265,841 of 548,734Top 50%
1
Patents 2021