Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876979 | Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction | Hisashi Konaka, Akihiro Himeda, Toru Mitsunaga | 2020-12-29 |
| 10801976 | Method for displaying measurement results from x-ray diffraction measurement | Akito Sasaki, Akihiro Himeda, Yukiko Ikeda | 2020-10-13 |