Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876979 | Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction | Akihiro Himeda, Toru Mitsunaga, Keigo Nagao | 2020-12-29 |