Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876979 | Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction | Hisashi Konaka, Akihiro Himeda, Keigo Nagao | 2020-12-29 |
| 10837923 | X-ray analysis device and method for optical axis alignment thereof | Shintaro Kobayashi, Katsuhiko Inaba | 2020-11-17 |
| 10732134 | X-ray diffraction apparatus | Takeshi Osakabe | 2020-08-04 |