Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10837923 | X-ray analysis device and method for optical axis alignment thereof | Shintaro Kobayashi, Toru Mitsunaga | 2020-11-17 |
| 10585053 | X-ray diffractometer | Shintaro Kobayashi | 2020-03-10 |