Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10801976 | Method for displaying measurement results from x-ray diffraction measurement | Akihiro Himeda, Yukiko Ikeda, Keigo Nagao | 2020-10-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10801976 | Method for displaying measurement results from x-ray diffraction measurement | Akihiro Himeda, Yukiko Ikeda, Keigo Nagao | 2020-10-13 |