Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10838809 | Memory array and measuring and testing methods for inter-hamming differences of memory array | Shih-Lien Linus Lu, Kun-Hsi Li | 2020-11-17 |
| 10740174 | Memory address protection circuit and method | Ramin SHARIAT-YAZDI, Shih-Lien Linus Lu | 2020-08-11 |
| 10705934 | Scan synchronous-write-through testing architectures for a memory device | Ming-Hung Chang, Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald George Mikan, Jr. +5 more | 2020-07-07 |
| 10539617 | Scan architecture for interconnect testing in 3D integrated circuits | Sandeep Kumar Goel, Yun-Han Lee, Marat Gershoig | 2020-01-21 |