Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10877089 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Tien-Wei Chiang, Chia Yu Wang | 2020-12-29 |
| 10818609 | Package structure and method for fabricating the same | Harry-Hak-Lay Chuang, Chia-Hsiang Chen, Ching-Huang Wang, Tien-Wei Chiang | 2020-10-27 |
| 10665321 | Method for testing MRAM device and test apparatus thereof | Chia Yu Wang, Ching-Huang Wang, Chun-Jung Lin, Tien-Wei Chiang, Kuei-Hung Shen | 2020-05-26 |