Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10877089 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Tien-Wei Chiang, Meng-Chun Shih | 2020-12-29 |
| 10665321 | Method for testing MRAM device and test apparatus thereof | Ching-Huang Wang, Chun-Jung Lin, Tien-Wei Chiang, Meng-Chun Shih, Kuei-Hung Shen | 2020-05-26 |