Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10825650 | Machine learning on wafer defect review | Chung-Pin Chou, Sheng-Wen Huang | 2020-11-03 |
| 10784114 | Methods of enhancing surface topography on a substrate for inspection | Han-Wen Liao, Chun-Chih Lin | 2020-09-22 |
| 10755405 | Method and system for diagnosing a semiconductor wafer | Yen-Liang Chen | 2020-08-25 |
| 10748354 | Communication method, device, and system for vehicle remote diagnosis | Zhijian Chen, Xiu-Zhi CHEN, Shelin Shen, Liang Zhang, Wei Zhang +1 more | 2020-08-18 |