Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10871454 | Inspection method and apparatus | Yu-Liang Tseng | 2020-12-22 |
| 10825650 | Machine learning on wafer defect review | Sheng-Wen Huang, Jun Liu | 2020-11-03 |
CC
Chung-Pin Chou
Overall (2020): #186,729 of 565,922Top 35%
2
Patents 2020