Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10831095 | Critical dimension measurement system and method of measuring critical dimensions using same | Won Joo Park, Hyung Joo Lee, Seuk Hwan Choi, Dong-Seok Nam | 2020-11-10 |
YH
Yoon Taek Han
Overall (2020): #213,446 of 565,922Top 40%
1
Patents 2020